Recommendation ITU-T K specifies resistibility requirements and test procedures for telecommunication equipment that is installed in or on a customer’s. Recommendation ITU-T K specifies resistibility requirements and test The approval of ITU-T Recommendations is covered by the procedure laid down in. ITU-T Recommendation K was revised by ITU-T Study Group 5 () The approval of ITU-T Recommendations is covered by the.

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Patent statement s Development history [ 11 related work items in progress ]. Study Groups tree view. Entire test installations can be integrated in one single test sequence. A summary of test results is given. All relevant parameters are automatically set accordingly. In the Otu-t Pulse window you can select the required test level as requested for the test.

Standard updates New standards implemented in the 8. Controller for External Measuring Equipment.

Overvoltages or overcurrents covered by this Recommendation include surges due to lightning on or near the line plant, short-term induction from adjacent a. Minimum operator effort for maximum test results, easy and fast, reliable and reproducible. User Defined Test routines ,21 easily created and saved to the test files library. Major changes compared with the version of this Recommendation include: Program entire Test Sequences using the iec.

Editions Related supplement s Implementer’s guide s Ed. Please send us your inquiry! This functionality allows fully automated test runs combining different test requirements.

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Committed to connecting the world. Analysis of electromagnetic compatibility aspects and definition of requirements for 5G mobile systems. Complete Reporting according to International Standards Requirements. Product selector Product news Data sheets Software autowave.

International Standards

By continuing to use the site you agree to our privacy and cookie policy. No matter if you want to verify the test pulse before conducting a test or to monitor the DUTs behaviour during test iec. The current version iec.

Standard Test Routines are started by a few key strokes only with all parameter settings already pre-programmed. Feedback Contact Us Accessibility. Electromagnetic field compliance assessments for 5G wireless networks. Resistibility analysis of 5G systems. Using respective mask files the test report can be arranged and printed out to comply with company specific requirements.

In this mode all parameters are open to be changed.

ITU-T Recommendations

The continuously updated and extensive standards library is only one of these benefits. Very few remote control commands are required to itu-h your instrument. A test can be stopped at the point any malfunction occurs. An exhaustive standards library includes international basic and generic standards, product family standards and product standards from various application areas. Or if less severe iec. Select Language english german french japanese polish russian chinese.

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The sources for overvoltages in internal lines are mainly inductive coupling caused by lightning currents being conducted in nearby lightning strokes or lightning currents being conducted in nearby conductors.

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Graphics of the test pulses accomplish the parameter settings. Editions Related supplement s Implementer’s guide s. Resistibility of telecommunication equipment installed in customer premises to overvoltages and overcurrents. The test data file can be automatically converted into Rich-Text-Format and post-processed with any software tool recognising rtf-format e.

The more complex a DUT is the higher is the demand for monitoring during the test and control the test based on the feedback received. Test parameter settings and detailed test data e. Not only single tests, either user defined or based on standards, can be performed, but single Test routines can be linked together to form a complete test sequence.

ITU-T K21 Archives – Accelonix

Contact Recommend page Sitemap Imprint Privacy. Radiofrequency electromagnetic field RF-EMF exposure levels from mobile and portable devices during different conditions of use. Recorded fail events are stated along with the comments entered by the operator. The header includes all general data of the test e. New standards implemented in the 8. User Defined Test routines based on standard test routines can be created in the Special Mode from each standard pulse window.

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